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Information card for entry 2226659
Preview
Coordinates | 2226659.cif |
---|---|
Structure factors | 2226659.hkl |
Original IUCr paper | HTML |
Chemical name | Tetrakis{μ~3~-2-[(2-hydroxyethyl)amino]ethanolato}tetrakis[chloridonickel(II)] methanol solvate |
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Formula | C17 H44 Cl4 N4 Ni4 O9 |
Calculated formula | C17 H44 Cl4 N4 Ni4 O9 |
SMILES | [Ni]1234(Cl)[O]5([Ni]678(Cl)[O]1([Ni]19%10(Cl)[O]%116[Ni]65(Cl)([O]21CC[NH]9CC[OH]%10)[OH]CC[NH]6CC%11)CC[NH]8CC[OH]7)CC[NH]4CC[OH]3.OC |
Title of publication | Tetrakis{μ~3~-2-[(2-hydroxyethyl)amino]ethanolato}tetrakis[chloridonickel(II)] methanol solvate |
Authors of publication | Yu, Youzhu; Guo, Yuhua; Lv, Lei; Li, Dacheng |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2010 |
Journal volume | 66 |
Journal issue | 7 |
Pages of publication | m861 |
a | 10.8244 ± 0.0012 Å |
b | 11.5609 ± 0.0013 Å |
c | 13.2797 ± 0.0017 Å |
α | 91.741 ± 0.001° |
β | 91.845 ± 0.001° |
γ | 111.283 ± 0.002° |
Cell volume | 1546.1 ± 0.3 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0678 |
Residual factor for significantly intense reflections | 0.0429 |
Weighted residual factors for significantly intense reflections | 0.1157 |
Weighted residual factors for all reflections included in the refinement | 0.1409 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.013 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2226659.html
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