Information card for entry 2226945
| Common name |
Decafluorochalcone |
| Chemical name |
(<i>E</i>)-1,3-Bis(2,3,4,5,6-pentafluorophenyl)prop-2-en-1-one |
| Formula |
C15 H2 F10 O |
| Calculated formula |
C15 H2 F10 O |
| SMILES |
O=C(/C=C/c1c(F)c(F)c(F)c(F)c1F)c1c(F)c(F)c(F)c(F)c1F |
| Title of publication |
(<i>E</i>)-1,3-Bis(2,3,4,5,6-pentafluorophenyl)prop-2-en-1-one |
| Authors of publication |
Schwarzer, Anke; Weber, Edwin |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2010 |
| Journal volume |
66 |
| Journal issue |
8 |
| Pages of publication |
o1931 |
| a |
11.444 ± 0.001 Å |
| b |
9.563 ± 0.001 Å |
| c |
12.138 ± 0.002 Å |
| α |
90° |
| β |
101.414 ± 0.003° |
| γ |
90° |
| Cell volume |
1302.1 ± 0.3 Å3 |
| Cell temperature |
93 ± 2 K |
| Ambient diffraction temperature |
93 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0454 |
| Residual factor for significantly intense reflections |
0.0316 |
| Weighted residual factors for significantly intense reflections |
0.0748 |
| Weighted residual factors for all reflections included in the refinement |
0.0795 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.083 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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