Information card for entry 2227764
Chemical name |
[μ-<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-Tetrakis(2-pyridylmethyl)butane- 1,4-diamine]bis[dibromidocopper(II)] |
Formula |
C28 H32 Br4 Cu2 N6 |
Calculated formula |
C28 H32 Br4 Cu2 N6 |
SMILES |
C1c2cccc[n]2[Cu]2([N]1(Cc1cccc[n]21)CCCC[N]12Cc3cccc[n]3[Cu]2([n]2c(C1)cccc2)(Br)Br)(Br)Br |
Title of publication |
[μ-<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-Tetrakis(2-pyridylmethyl)butane-1,4-diamine]bis[dibromidocopper(II)] |
Authors of publication |
Bartholomä, Mark; Cheung, Hoi; Zubieta, Jon |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2010 |
Journal volume |
66 |
Journal issue |
10 |
Pages of publication |
m1198 |
a |
8.8613 ± 0.0006 Å |
b |
14.249 ± 0.001 Å |
c |
11.9488 ± 0.0009 Å |
α |
90° |
β |
98.588 ± 0.002° |
γ |
90° |
Cell volume |
1491.8 ± 0.18 Å3 |
Cell temperature |
90 ± 2 K |
Ambient diffraction temperature |
90 ± 2 K |
Number of distinct elements |
5 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/n 1 |
Hall space group symbol |
-P 2yn |
Residual factor for all reflections |
0.0843 |
Residual factor for significantly intense reflections |
0.0736 |
Weighted residual factors for significantly intense reflections |
0.144 |
Weighted residual factors for all reflections included in the refinement |
0.1474 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.375 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2227764.html