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Information card for entry 2227925
Preview
| Coordinates | 2227925.cif |
|---|---|
| Structure factors | 2227925.hkl |
| Original IUCr paper | HTML |
| External links | PubChem |
| Chemical name | Tetrakis[μ-2-(3,4-dimethoxyphenyl)acetato]- κ^3^<i>O</i>^1^,<i>O</i>^1'^:<i>O</i>^1^; κ^3^<i>O</i>^1^:<i>O</i>^1^,<i>O</i>^1'^;κ^4^<i>O</i>^1^:<i>O</i>^1'^- bis{[2-(3,4-dimethoxyphenyl)acetato-κ^2^<i>O</i>^1^,<i>O</i>^1'^](1,10- phenanthroline-κ^2^<i>N</i>,<i>N</i>')erbium(III)} |
|---|---|
| Formula | C84 H82 Er2 N4 O24 |
| Calculated formula | C84 H82 Er2 N4 O24 |
| SMILES | c1(ccc(CC2=[O][Er]34567([n]8cccc9c8c8[n]4cccc8cc9)(O2)[O]=C([O]5[Er]245([O]=C(Cc8cc(c(cc8)OC)OC)O6)([n]6cccc8ccc9ccc[n]2c9c68)([O]=C(Cc2ccc(c(c2)OC)OC)O5)([O]=C([O]74)Cc2cc(OC)c(OC)cc2)[O]=C(Cc2cc(OC)c(cc2)OC)O3)Cc2cc(OC)c(OC)cc2)cc1OC)OC |
| Title of publication | Tetrakis[μ-2-(3,4-dimethoxyphenyl)acetato]-κ^3^<i>O</i>^1^,<i>O</i>^1'^:<i>O</i>^1^;κ^3^<i>O</i>^1^:<i>O</i>^1^,<i>O</i>^1'^;κ^4^<i>O</i>^1^:<i>O</i>^1'^-bis{[2-(3,4-dimethoxyphenyl)acetato-κ^2^<i>O</i>^1^,<i>O</i>^1'^](1,10-phenanthroline-κ^2^<i>N</i>,<i>N</i>')erbium(III)} |
| Authors of publication | Liu, Jia-Lu; Li, Hua-Qiong; Zhao, Guo-Liang |
| Journal of publication | Acta Crystallographica Section E |
| Year of publication | 2010 |
| Journal volume | 66 |
| Journal issue | 11 |
| Pages of publication | m1411 |
| a | 12.3101 ± 0.0001 Å |
| b | 12.3646 ± 0.0001 Å |
| c | 14.626 ± 0.0002 Å |
| α | 91.233 ± 0.001° |
| β | 103.469 ± 0.001° |
| γ | 114.876 ± 0.001° |
| Cell volume | 1946.02 ± 0.04 Å3 |
| Cell temperature | 296 ± 2 K |
| Ambient diffraction temperature | 296 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.03 |
| Residual factor for significantly intense reflections | 0.023 |
| Weighted residual factors for significantly intense reflections | 0.0547 |
| Weighted residual factors for all reflections included in the refinement | 0.0594 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.999 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2227925.html
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