Information card for entry 2228245
Common name |
<i>(S,S)</i>-TsDPEN |
Chemical name |
<i>N</i>-[(1<i>S</i>,2<i>S</i>)-2-Amino-1,2-diphenylethyl]-4- methylbenzenesulfonamide |
Formula |
C21 H22 N2 O2 S |
Calculated formula |
C21 H22 N2 O2 S |
SMILES |
c1(ccc(cc1)C)S(=O)(=O)N[C@@H](c1ccccc1)[C@@H](N)c1ccccc1 |
Title of publication |
<i>N</i>-[(1<i>S</i>,2<i>S</i>)-2-Amino-1,2-diphenylethyl]-4-methylbenzenesulfonamide [(<i>S</i>,<i>S</i>)-TsDPEN] |
Authors of publication |
Schlemmer, Claudine; Schollmeyer, Dieter; Blank, Nancy; Stoye, Alexander; Opatz, Till |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2010 |
Journal volume |
66 |
Journal issue |
12 |
Pages of publication |
o3343 |
a |
6.3892 ± 0.0006 Å |
b |
12.229 ± 0.0011 Å |
c |
24.281 ± 0.002 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
1897.2 ± 0.3 Å3 |
Cell temperature |
173 ± 2 K |
Ambient diffraction temperature |
173 ± 2 K |
Number of distinct elements |
5 |
Space group number |
19 |
Hermann-Mauguin space group symbol |
P 21 21 21 |
Hall space group symbol |
P 2ac 2ab |
Residual factor for all reflections |
0.0487 |
Residual factor for significantly intense reflections |
0.0363 |
Weighted residual factors for significantly intense reflections |
0.0809 |
Weighted residual factors for all reflections included in the refinement |
0.0862 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.022 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2228245.html