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Information card for entry 2228973
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Coordinates | 2228973.cif |
---|---|
Structure factors | 2228973.hkl |
Original IUCr paper | HTML |
Common name | Enrofloxacinium picrate |
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Chemical name | 4-(3-carboxy-6-fluoro-4-oxo-1,4-dihydroquinolin-7-yl)-1-ethylpiperazin-1-ium 2,4,6-trinitrophenolate |
Formula | C25 H25 F N6 O10 |
Calculated formula | C25 H25 F N6 O10 |
SMILES | Fc1c(N2CC[NH+](CC2)CC)cc2n(cc(C(=O)O)c(=O)c2c1)C1CC1.[O-]c1c(cc(cc1N(=O)=O)N(=O)=O)N(=O)=O |
Title of publication | Enrofloxacinium picrate |
Authors of publication | Jasinski, Jerry P.; Butcher, Ray J.; Siddegowda, M. S.; Yathirajan, H. S.; Siddaraju, B. P. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2011 |
Journal volume | 67 |
Journal issue | 2 |
Pages of publication | o432 - o433 |
a | 7.2111 ± 0.0007 Å |
b | 12.5766 ± 0.0007 Å |
c | 16.2362 ± 0.0004 Å |
α | 105.556 ± 0.002° |
β | 96.367 ± 0.006° |
γ | 96.223 ± 0.007° |
Cell volume | 1395.04 ± 0.16 Å3 |
Cell temperature | 295 ± 2 K |
Ambient diffraction temperature | 295 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0817 |
Residual factor for significantly intense reflections | 0.0553 |
Weighted residual factors for significantly intense reflections | 0.1568 |
Weighted residual factors for all reflections included in the refinement | 0.1774 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.996 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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The link is: https://www.crystallography.net/2228973.html
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Users of the data should acknowledge the original authors of the
structural data.