Information card for entry 2228980
Chemical name |
(4,7-Diphenyl-1,10-phenanthroline- κ^2^<i>N</i>,<i>N'</i>)dimethylbis(thiocyanato-κ<i>N</i>)tin(IV) |
Formula |
C28 H22 N4 S2 Sn |
Calculated formula |
C28 H22 N4 S2 Sn |
SMILES |
[Sn]1([n]2c3c4[n]1ccc(c4ccc3c(cc2)c1ccccc1)c1ccccc1)(N=C=S)(N=C=S)(C)C |
Title of publication |
(4,7-Diphenyl-1,10-phenanthroline-κ^2^<i>N</i>,<i>N</i>')dimethylbis(thiocyanato-κ<i>N</i>)tin(IV) |
Authors of publication |
Najafi, Ezzatollah; Amini, Mostafa M.; Ng, Seik Weng |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2011 |
Journal volume |
67 |
Journal issue |
2 |
Pages of publication |
m244 |
a |
17.1918 ± 0.0002 Å |
b |
8.1907 ± 0.0002 Å |
c |
18.3045 ± 0.0003 Å |
α |
90° |
β |
98.042 ± 0.001° |
γ |
90° |
Cell volume |
2552.16 ± 0.08 Å3 |
Cell temperature |
100 ± 2 K |
Ambient diffraction temperature |
100 ± 2 K |
Number of distinct elements |
5 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/n 1 |
Hall space group symbol |
-P 2yn |
Residual factor for all reflections |
0.0447 |
Residual factor for significantly intense reflections |
0.0336 |
Weighted residual factors for significantly intense reflections |
0.0752 |
Weighted residual factors for all reflections included in the refinement |
0.0835 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.031 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2228980.html