Information card for entry 2229948
Chemical name |
<i>N</i>,<i>N</i>'-[(1<i>S</i>,2<i>S</i>)-Cyclohexane-1,2-diyl]bis(4- methylbenzenesulfonamide) |
Formula |
C20 H26 N2 O4 S2 |
Calculated formula |
C20 H26 N2 O4 S2 |
SMILES |
S(=O)(=O)(c1ccc(C)cc1)N[C@@H]1[C@@H](NS(=O)(=O)c2ccc(C)cc2)CCCC1 |
Title of publication |
<i>N</i>,<i>N</i>'-[(1<i>S</i>,2<i>S</i>)-Cyclohexane-1,2-diyl]bis(4-methylbenzenesulfonamide) |
Authors of publication |
Hong, Yi-Ling; Tan, Hua-Jie; Shen, Liang |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2011 |
Journal volume |
67 |
Journal issue |
5 |
Pages of publication |
o1121 |
a |
11.5704 ± 0.0014 Å |
b |
12.2585 ± 0.0015 Å |
c |
15.3757 ± 0.0019 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
2180.8 ± 0.5 Å3 |
Cell temperature |
296 ± 1 K |
Ambient diffraction temperature |
296 ± 2 K |
Number of distinct elements |
5 |
Space group number |
19 |
Hermann-Mauguin space group symbol |
P 21 21 21 |
Hall space group symbol |
P 2ac 2ab |
Residual factor for all reflections |
0.041 |
Residual factor for significantly intense reflections |
0.0353 |
Weighted residual factors for significantly intense reflections |
0.089 |
Weighted residual factors for all reflections included in the refinement |
0.0938 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.001 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2229948.html