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Information card for entry 2230655
Preview
Coordinates | 2230655.cif |
---|---|
Structure factors | 2230655.hkl |
Original IUCr paper | HTML |
Chemical name | 9-(3,4-Dimethoxyphenyl)-3,3,6,6-tetramethyl-4,5,6,9-tetrahydro- 3<i>H</i>-xanthene-1,8(2<i>H</i>,7<i>H</i>)-dione |
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Formula | C25 H30 O5 |
Calculated formula | C25 H30 O5 |
SMILES | COc1ccc(cc1OC)C1C2=C(OC3=C1C(=O)CC(C3)(C)C)CC(CC2=O)(C)C |
Title of publication | 9-(3,4-Dimethoxyphenyl)-3,3,6,6-tetramethyl-4,5,6,9-tetrahydro-3<i>H</i>-xanthene-1,8(2<i>H</i>,7<i>H</i>)-dione |
Authors of publication | Mehdi, Sayed Hasan; Sulaiman, Othman; Ghalib, Raza Murad; Yeap, Chin Sing; Fun, Hoong-Kun |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2011 |
Journal volume | 67 |
Journal issue | 7 |
Pages of publication | o1719 - o1720 |
a | 9.4895 ± 0.0007 Å |
b | 10.2283 ± 0.0007 Å |
c | 23.3218 ± 0.0016 Å |
α | 85.872 ± 0.004° |
β | 86.537 ± 0.004° |
γ | 74.425 ± 0.003° |
Cell volume | 2172.9 ± 0.3 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 3 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0743 |
Residual factor for significantly intense reflections | 0.0535 |
Weighted residual factors for significantly intense reflections | 0.1172 |
Weighted residual factors for all reflections included in the refinement | 0.1273 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2230655.html
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Users of the data should acknowledge the original authors of the
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