Information card for entry 2231091
Common name |
[2.1.1]cryptand siliconhexafluoride |
Chemical name |
4,7,13,18-Tetraoxa-1,10-diazoniabicyclo[8.5.5]icosane hexafluoridosilicate |
Formula |
C14 H30 F6 N2 O4 Si |
Calculated formula |
C14 H30 F6 N2 O4 Si |
SMILES |
C1COCCOCC[NH+]2CCOCC[NH+]1CCOCC2.F[Si](F)(F)(F)([F-])[F-] |
Title of publication |
4,7,13,18-Tetraoxa-1,10-diazoniabicyclo[8.5.5]icosane hexafluoridosilicate |
Authors of publication |
Sen Gupta, Nalinava; Wragg, David S.; Tilset, Mats; Omtvedt, Jon Petter |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2011 |
Journal volume |
67 |
Journal issue |
8 |
Pages of publication |
o1958 - o1959 |
a |
10.05 ± 0.005 Å |
b |
23.218 ± 0.005 Å |
c |
8.031 ± 0.005 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
1874 ± 1.5 Å3 |
Cell temperature |
293 ± 2 K |
Ambient diffraction temperature |
293 ± 2 K |
Number of distinct elements |
6 |
Space group number |
60 |
Hermann-Mauguin space group symbol |
P b c n |
Hall space group symbol |
-P 2n 2ab |
Residual factor for all reflections |
0.0774 |
Residual factor for significantly intense reflections |
0.039 |
Weighted residual factors for significantly intense reflections |
0.0968 |
Weighted residual factors for all reflections included in the refinement |
0.1157 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.021 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2231091.html