Information card for entry 2231163
Chemical name |
9-(4-Hydroxyphenyl)-3,3,6,6-tetramethyl-4,5,6,9-tetrahydro-3<i>H</i>- xanthene-1,8(2<i>H</i>,7<i>H</i>)-dione |
Formula |
C23 H26 O4 |
Calculated formula |
C23 H26 O4 |
SMILES |
O1C2=C(C(=O)CC(C2)(C)C)C(C2=C1CC(CC2=O)(C)C)c1ccc(O)cc1 |
Title of publication |
9-(4-Hydroxyphenyl)-3,3,6,6-tetramethyl-4,5,6,9-tetrahydro-3<i>H</i>-xanthene-1,8(2<i>H</i>,7<i>H</i>)-dione |
Authors of publication |
Fun, Hoong-Kun; Loh, Wan-Sin; Rajesh, K.; Vijayakumar, V.; Sarveswari, S. |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2011 |
Journal volume |
67 |
Journal issue |
8 |
Pages of publication |
o1876 - o1877 |
a |
9.3525 ± 0.0001 Å |
b |
10.214 ± 0.0001 Å |
c |
11.6913 ± 0.0001 Å |
α |
67.271 ± 0.001° |
β |
76.119 ± 0.001° |
γ |
69.419 ± 0.001° |
Cell volume |
957.322 ± 0.018 Å3 |
Cell temperature |
100 ± 0.1 K |
Ambient diffraction temperature |
100 ± 0.1 K |
Number of distinct elements |
3 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.0452 |
Residual factor for significantly intense reflections |
0.0387 |
Weighted residual factors for significantly intense reflections |
0.1127 |
Weighted residual factors for all reflections included in the refinement |
0.1194 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.045 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2231163.html