Information card for entry 2231192
| Chemical name |
1,1,2,2-Tetrakis(1,3-benzoxazol-2-yl)ethene |
| Formula |
C30 H16 N4 O4 |
| Calculated formula |
C30 H16 N4 O4 |
| SMILES |
c1ccc2c(c1)oc(n2)C(=C(c1nc2c(o1)cccc2)c1nc2c(o1)cccc2)c1nc2c(o1)cccc2 |
| Title of publication |
1,1,2,2-Tetrakis(1,3-benzoxazol-2-yl)ethene |
| Authors of publication |
Hagos, Tesfamariam K.; Nogai, Stefan D.; Dobrzańska, Liliana; Cronje, Stephanie; Raubenheimer, Helgard G. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2011 |
| Journal volume |
67 |
| Journal issue |
8 |
| Pages of publication |
o2014 |
| a |
9.2697 ± 0.0009 Å |
| b |
16.1943 ± 0.0016 Å |
| c |
8.0332 ± 0.0008 Å |
| α |
90° |
| β |
104.395 ± 0.002° |
| γ |
90° |
| Cell volume |
1168.1 ± 0.2 Å3 |
| Cell temperature |
273 ± 2 K |
| Ambient diffraction temperature |
273 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0534 |
| Residual factor for significantly intense reflections |
0.0485 |
| Weighted residual factors for significantly intense reflections |
0.1171 |
| Weighted residual factors for all reflections included in the refinement |
0.1208 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.064 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2231192.html