Information card for entry 2231199
Chemical name |
(3<i>S</i>,12<i>R</i>,20<i>S</i>,24<i>R</i>)-20,24-Epoxydammarane-3,12,25-triol |
Formula |
C30 H52 O4 |
Calculated formula |
C30 H52 O4 |
SMILES |
O[C@@H]1C[C@@H]2[C@@]3(C)CC[C@@H](C([C@@H]3CC[C@]2([C@]2([C@H]1[C@H](CC2)[C@]1(C)CC[C@@H](O1)C(O)(C)C)C)C)(C)C)O |
Title of publication |
(3<i>S</i>,12<i>R</i>,20<i>S</i>,24<i>R</i>)-20,24-Epoxydammarane-3,12,25-triol |
Authors of publication |
Li, Wen-Juan; Guo, Huan-Mei; Ji, Chun-Mei; Bi, Yi; Meng, Qing-Guo |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2011 |
Journal volume |
67 |
Journal issue |
8 |
Pages of publication |
o2112 |
a |
7.6795 ± 0.0014 Å |
b |
13.067 ± 0.003 Å |
c |
28.084 ± 0.005 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
2818.2 ± 1 Å3 |
Cell temperature |
298 ± 2 K |
Ambient diffraction temperature |
298 ± 2 K |
Number of distinct elements |
3 |
Space group number |
19 |
Hermann-Mauguin space group symbol |
P 21 21 21 |
Hall space group symbol |
P 2ac 2ab |
Residual factor for all reflections |
0.1026 |
Residual factor for significantly intense reflections |
0.0615 |
Weighted residual factors for significantly intense reflections |
0.1144 |
Weighted residual factors for all reflections included in the refinement |
0.128 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.055 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
Yes |
Has Fobs |
Yes |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/2231199.html