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Information card for entry 2231588
Preview
Coordinates | 2231588.cif |
---|---|
Structure factors | 2231588.hkl |
Original IUCr paper | HTML |
Common name | <i>N</i>,<i>N</i>'-(Ethane-1,2-diyl)bis(4-chlorobenzenesulfonamide) |
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Chemical name | 4-chloro-<i>N</i>-[2-(4-chlorobenzenesulfonamido)ethyl]benzenesulfonamide |
Formula | C14 H14 Cl2 N2 O4 S2 |
Calculated formula | C14 H14 Cl2 N2 O4 S2 |
SMILES | Clc1ccc(cc1)S(=O)(=O)NCCNS(=O)(=O)c1ccc(cc1)Cl |
Title of publication | <i>N</i>,<i>N</i>'-(Ethane-1,2-diyl)bis(4-chlorobenzenesulfonamide) |
Authors of publication | Al-Dajani, Mohammad T. M.; Wahab, Habibah A.; Shamsuddin, Shaharum; Hemamalini, Madhukar; Fun, Hoong-Kun |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2011 |
Journal volume | 67 |
Journal issue | 9 |
Pages of publication | o2241 |
a | 13.264 ± 0.0005 Å |
b | 5.339 ± 0.0002 Å |
c | 13.1792 ± 0.0005 Å |
α | 90° |
β | 110.27 ± 0.001° |
γ | 90° |
Cell volume | 875.51 ± 0.06 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0681 |
Residual factor for significantly intense reflections | 0.0544 |
Weighted residual factors for significantly intense reflections | 0.1587 |
Weighted residual factors for all reflections included in the refinement | 0.1754 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2231588.html
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