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Information card for entry 2231913
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Coordinates | 2231913.cif |
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Structure factors | 2231913.hkl |
Original IUCr paper | HTML |
Common name | 4,4'-Difluorobenzhydryl piperazinium picrate |
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Chemical name | 4-[bis(4-fluorophenyl)methyl]piperazin-1-ium 2,4,6-trinitrophenolate |
Formula | C23 H21 F2 N5 O7 |
Calculated formula | C23 H21 F2 N5 O7 |
SMILES | Fc1ccc(C(N2CC[NH2+]CC2)c2ccc(F)cc2)cc1.[O-]c1c(cc(N(=O)=O)cc1N(=O)=O)N(=O)=O |
Title of publication | 4-[Bis(4-fluorophenyl)methyl]piperazin-1-ium picrate |
Authors of publication | Betz, Richard; Gerber, Thomas; Hosten, Eric; Dayananda, Alaloor S.; Yathirajan, Hemmige S.; Narayana, Badiadka |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2011 |
Journal volume | 67 |
Journal issue | 10 |
Pages of publication | o2587 - o2588 |
a | 8.9425 ± 0.0002 Å |
b | 11.8286 ± 0.0002 Å |
c | 23.0922 ± 0.0004 Å |
α | 90° |
β | 105.72 ± 0.001° |
γ | 90° |
Cell volume | 2351.27 ± 0.08 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0454 |
Residual factor for significantly intense reflections | 0.0392 |
Weighted residual factors for significantly intense reflections | 0.1044 |
Weighted residual factors for all reflections included in the refinement | 0.1107 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.027 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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Users of the data should acknowledge the original authors of the
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