Information card for entry 2232075
Chemical name |
2-(Biphenyl-4-yl)-5-[3-(4,5,6,7-tetrahydrothieno[3,2-<i>c</i>]pyridine- 5-ylsulfonyl)thiophen-2-yl]-1,3,4-oxadiazole |
Formula |
C25 H19 N3 O3 S3 |
Calculated formula |
C25 H19 N3 O3 S3 |
SMILES |
S(=O)(=O)(N1Cc2ccsc2CC1)c1c(scc1)c1oc(nn1)c1ccc(c2ccccc2)cc1 |
Title of publication |
2-(Biphenyl-4-yl)-5-[3-(4,5,6,7-tetrahydrothieno[3,2-<i>c</i>]pyridine-5-ylsulfonyl)thiophen-2-yl]-1,3,4-oxadiazole |
Authors of publication |
Fun, Hoong-Kun; Hemamalini, Madhukar; Rai, Sankappa; Isloor, A. M.; Shetty, Prakash |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2011 |
Journal volume |
67 |
Journal issue |
10 |
Pages of publication |
o2781 - o2782 |
a |
7.9108 ± 0.0001 Å |
b |
12.0943 ± 0.0001 Å |
c |
12.9498 ± 0.0002 Å |
α |
69.253 ± 0.001° |
β |
76.794 ± 0.001° |
γ |
77.46 ± 0.001° |
Cell volume |
1115.3 ± 0.03 Å3 |
Cell temperature |
100 ± 1 K |
Ambient diffraction temperature |
100 ± 1 K |
Number of distinct elements |
5 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.0928 |
Residual factor for significantly intense reflections |
0.0529 |
Weighted residual factors for significantly intense reflections |
0.106 |
Weighted residual factors for all reflections included in the refinement |
0.1216 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.025 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/2232075.html