Information card for entry 2232224

Structure parameters

• Chemical name: Tetrakis(triphenylphosphane-κ<i>P</i>)silver(I) trifluoromethanesulfonate dichloromethane monosolvate
• Formula: C74 H62 Ag Cl2 F3 O3 P4 S
• Calculated formula: C74 H62 Ag Cl2 F3 O3 P4 S
• SMILES: [Ag]([P](c1ccccc1)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1.S(=O)(=O)([O-])C(F)(F)F.ClCCl
• Title of publication: Tetrakis(triphenylphosphane-κ<i>P</i>)silver(I) trifluoromethanesulfonate dichloromethane monosolvate
• Authors of publication: Jiang, Yu-Hang; Cui, Li-Na; Huang, Xu; Jin, Qiong-Hua; Zhang, Cun-Lin
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2011
• Journal volume: 67
• Journal issue: 11
• Pages of publication: m1499
• a: 11.9868 ± 0.0011 Å
• b: 14.7498 ± 0.0014 Å
• c: 18.7887 ± 0.0017 Å
• α: 89.613 ± 0.002°
• β: 85.858 ± 0.001°
• γ: 88.49 ± 0.001°
• Cell volume: 3312 ± 0.5 ų
• Cell temperature: 298 ± 2 K
• Ambient diffraction temperature: 298 ± 2 K
• Number of distinct elements: 8
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.133
• Residual factor for significantly intense reflections: 0.0686
• Weighted residual factors for significantly intense reflections: 0.1681
• Weighted residual factors for all reflections included in the refinement: 0.2148
• Goodness-of-fit parameter for all reflections included in the refinement: 1.026
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes