Information card for entry 2232523
| Chemical name |
2-Sulfanylidene-1,3-dithiolo[4,5-<i>b</i>]naphtho[2,3-<i>e</i>][1,4]dithiine- 5,10-dione |
| Formula |
C13 H4 O2 S5 |
| Calculated formula |
C13 H4 O2 S5 |
| SMILES |
S1C(=S)SC2SC3=C(C(=O)c4c(C3=O)cccc4)SC1=2 |
| Title of publication |
2-Sulfanylidene-1,3-dithiolo[4,5-<i>b</i>]naphtho[2,3-<i>e</i>][1,4]dithiine-5,10-dione |
| Authors of publication |
Méndez-Rojas, Miguel Angel; Bernès, Sylvain; Pérez-Benítez, Aarón; Romero Zarazúa, María Fernanda; Castellanos-Uribe, Adrián |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2011 |
| Journal volume |
67 |
| Journal issue |
11 |
| Pages of publication |
o2837 |
| a |
7.8527 ± 0.0008 Å |
| b |
8.0281 ± 0.0009 Å |
| c |
12.0022 ± 0.0013 Å |
| α |
97.934 ± 0.009° |
| β |
89.227 ± 0.009° |
| γ |
117.867 ± 0.008° |
| Cell volume |
661.37 ± 0.13 Å3 |
| Cell temperature |
296 ± 1 K |
| Ambient diffraction temperature |
296 ± 1 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0533 |
| Residual factor for significantly intense reflections |
0.0345 |
| Weighted residual factors for significantly intense reflections |
0.0807 |
| Weighted residual factors for all reflections included in the refinement |
0.0903 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.02 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2232523.html