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Information card for entry 2232606
Preview
Coordinates | 2232606.cif |
---|---|
Structure factors | 2232606.hkl |
Original IUCr paper | HTML |
Chemical name | (1,2,3,4-Tetrahydroisoquinoline-2-carbodithioato- κ^2^<i>S</i>,<i>S</i>')(thiocyanato-κ<i>N</i>)(triphenylphosphane)nickel(II) |
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Formula | C29 H25 N2 Ni P S3 |
Calculated formula | C29 H25 N2 Ni P S3 |
SMILES | C(=N[Ni]1([P](c2ccccc2)(c2ccccc2)c2ccccc2)[S]=C(N2CCc3ccccc3C2)S1)=S |
Title of publication | (1,2,3,4-Tetrahydroisoquinoline-2-carbodithioato-κ^2^<i>S</i>,<i>S</i>')(thiocyanato-κ<i>N</i>)(triphenylphosphane)nickel(II) |
Authors of publication | Valarmathi, P.; Thirumaran, S.; Selvanayagam, S. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2011 |
Journal volume | 67 |
Journal issue | 12 |
Pages of publication | m1882 |
a | 13.7981 ± 0.0004 Å |
b | 13.1429 ± 0.0004 Å |
c | 14.9447 ± 0.0004 Å |
α | 90° |
β | 91.693 ± 0.002° |
γ | 90° |
Cell volume | 2708.99 ± 0.14 Å3 |
Cell temperature | 292 ± 2 K |
Ambient diffraction temperature | 292 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0683 |
Residual factor for significantly intense reflections | 0.0423 |
Weighted residual factors for significantly intense reflections | 0.1093 |
Weighted residual factors for all reflections included in the refinement | 0.1233 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2232606.html
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Users of the data should acknowledge the original authors of the
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