Information card for entry 2233193
| Chemical name |
Bis(4-fluorobenzyl)bis(4-phenyl-5-sulfanylidene-4,5-dihydro-1,3,4- thiodiazole-2-thiolato)tin(IV) |
| Formula |
C30 H22 F2 N4 S6 Sn |
| Calculated formula |
C30 H22 F2 N4 S6 Sn |
| SMILES |
[Sn](SC1=NN(C(=S)S1)c1ccccc1)(SC1=NN(C(=S)S1)c1ccccc1)(Cc1ccc(F)cc1)Cc1ccc(F)cc1 |
| Title of publication |
Bis(4-fluorobenzyl)bis(4-phenyl-5-sulfanylidene-4,5-dihydro-1,3,4-thiodiazole-2-thiolato)tin(IV) |
| Authors of publication |
Li, Lei; Zeng, Suyuan; Yan, Nana |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
1 |
| Pages of publication |
m83 |
| a |
10.856 ± 0.001 Å |
| b |
12.5901 ± 0.0013 Å |
| c |
13.3741 ± 0.0015 Å |
| α |
80.278 ± 0.002° |
| β |
66.686 ± 0.001° |
| γ |
77.918 ± 0.001° |
| Cell volume |
1634 ± 0.3 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.1533 |
| Residual factor for significantly intense reflections |
0.0598 |
| Weighted residual factors for significantly intense reflections |
0.083 |
| Weighted residual factors for all reflections included in the refinement |
0.102 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.833 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2233193.html