Information card for entry 2233290
Chemical name |
Bis(μ-trimethylsilanolato-κ^2^<i>O</i>:<i>O</i>)bis{[2-(2<i>H</i>- benzotriazol-2-yl)-4,6-di-<i>tert</i>-pentylphenolato- κ^2^<i>N</i>,<i>O</i>]zinc} |
Formula |
C50 H74 N6 O4 Si2 Zn2 |
Calculated formula |
C50 H74 N6 O4 Si2 Zn2 |
Title of publication |
Bis(μ-trimethylsilanolato-κ^2^<i>O</i>:<i>O</i>)bis{[2-(2<i>H</i>-benzotriazol-2-yl)-4,6-di-<i>tert</i>-pentylphenolato-κ^2^<i>N</i>,<i>O</i>]zinc} |
Authors of publication |
Lee, Hwi Hyun; Go, Min Jeong; Park, Ka Hyun; Kim, Youngjo; Lee, Junseong |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2012 |
Journal volume |
68 |
Journal issue |
1 |
Pages of publication |
m87 |
a |
10.764 ± 0.0004 Å |
b |
10.728 ± 0.0004 Å |
c |
23.2314 ± 0.0009 Å |
α |
90° |
β |
90.597 ± 0.002° |
γ |
90° |
Cell volume |
2682.53 ± 0.18 Å3 |
Cell temperature |
296 ± 2 K |
Ambient diffraction temperature |
296 ± 2 K |
Number of distinct elements |
6 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/c 1 |
Hall space group symbol |
-P 2ybc |
Residual factor for all reflections |
0.0685 |
Residual factor for significantly intense reflections |
0.0394 |
Weighted residual factors for significantly intense reflections |
0.0896 |
Weighted residual factors for all reflections included in the refinement |
0.1083 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.014 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
Yes |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2233290.html