Information card for entry 2233377
Chemical name |
Ethyl 2-phenyl-3-(4-phenyl-1,2,3-selenadiazol-5-yl)-3-<i>p</i>-tolylpropanoate |
Formula |
C26 H24 N2 O2 Se |
Calculated formula |
C26 H24 N2 O2 Se |
SMILES |
c1ccccc1c1c([C@H](c2ccc(cc2)C)[C@@H](c2ccccc2)C(=O)OCC)[se]nn1.c1ccccc1c1c([C@@H](c2ccc(cc2)C)[C@H](c2ccccc2)C(=O)OCC)[se]nn1 |
Title of publication |
Ethyl 2-phenyl-3-(4-phenyl-1,2,3-selenadiazol-5-yl)-3-<i>p</i>-tolylpropanoate |
Authors of publication |
Sankari, S.; Sugumar, P.; Manisankar, T.; Muthusubramanian, S.; Ponnuswamy, M. N. |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2012 |
Journal volume |
68 |
Journal issue |
2 |
Pages of publication |
o447 |
a |
12.148 ± 0.005 Å |
b |
12.333 ± 0.005 Å |
c |
16.522 ± 0.005 Å |
α |
90° |
β |
108.768 ± 0.005° |
γ |
90° |
Cell volume |
2343.7 ± 1.5 Å3 |
Cell temperature |
293 ± 2 K |
Ambient diffraction temperature |
293 ± 2 K |
Number of distinct elements |
5 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/c 1 |
Hall space group symbol |
-P 2ybc |
Residual factor for all reflections |
0.0822 |
Residual factor for significantly intense reflections |
0.0417 |
Weighted residual factors for significantly intense reflections |
0.098 |
Weighted residual factors for all reflections included in the refinement |
0.1143 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.021 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2233377.html