Information card for entry 2233442
| Chemical name |
[(4<i>S</i>,5<i>S</i>)-2,2-Dimethyl-1,3-dioxolane-4,5-diyl]bis[<i>N</i>- (thiophen-2-ylmethylidene)methanamine] |
| Formula |
C17 H20 N2 O2 S2 |
| Calculated formula |
C17 H20 N2 O2 S2 |
| SMILES |
s1c(/C=N/C[C@@H]2OC(O[C@H]2C/N=C/c2sccc2)(C)C)ccc1 |
| Title of publication |
[(4<i>S</i>,5<i>S</i>)-2,2-Dimethyl-1,3-dioxolane-4,5-diyl]bis[<i>N</i>-(thiophen-2-ylmethylidene)methanamine] |
| Authors of publication |
Jiang, Yan; Bian, Jing; Sun, Xiaoqiang |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
2 |
| Pages of publication |
o430 |
| a |
10.475 ± 0.002 Å |
| b |
7.4792 ± 0.0015 Å |
| c |
11.533 ± 0.002 Å |
| α |
90° |
| β |
92.339 ± 0.004° |
| γ |
90° |
| Cell volume |
902.8 ± 0.3 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
4 |
| Hermann-Mauguin space group symbol |
P 1 21 1 |
| Hall space group symbol |
P 2yb |
| Residual factor for all reflections |
0.055 |
| Residual factor for significantly intense reflections |
0.0381 |
| Weighted residual factors for significantly intense reflections |
0.0839 |
| Weighted residual factors for all reflections included in the refinement |
0.0924 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.016 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2233442.html