Information card for entry 2233442
Chemical name |
[(4<i>S</i>,5<i>S</i>)-2,2-Dimethyl-1,3-dioxolane-4,5-diyl]bis[<i>N</i>- (thiophen-2-ylmethylidene)methanamine] |
Formula |
C17 H20 N2 O2 S2 |
Calculated formula |
C17 H20 N2 O2 S2 |
SMILES |
s1c(/C=N/C[C@@H]2OC(O[C@H]2C/N=C/c2sccc2)(C)C)ccc1 |
Title of publication |
[(4<i>S</i>,5<i>S</i>)-2,2-Dimethyl-1,3-dioxolane-4,5-diyl]bis[<i>N</i>-(thiophen-2-ylmethylidene)methanamine] |
Authors of publication |
Jiang, Yan; Bian, Jing; Sun, Xiaoqiang |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2012 |
Journal volume |
68 |
Journal issue |
2 |
Pages of publication |
o430 |
a |
10.475 ± 0.002 Å |
b |
7.4792 ± 0.0015 Å |
c |
11.533 ± 0.002 Å |
α |
90° |
β |
92.339 ± 0.004° |
γ |
90° |
Cell volume |
902.8 ± 0.3 Å3 |
Cell temperature |
296 ± 2 K |
Ambient diffraction temperature |
296 ± 2 K |
Number of distinct elements |
5 |
Space group number |
4 |
Hermann-Mauguin space group symbol |
P 1 21 1 |
Hall space group symbol |
P 2yb |
Residual factor for all reflections |
0.055 |
Residual factor for significantly intense reflections |
0.0381 |
Weighted residual factors for significantly intense reflections |
0.0839 |
Weighted residual factors for all reflections included in the refinement |
0.0924 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.016 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/2233442.html