Information card for entry 2233458
| Chemical name |
9-[(<i>E</i>)-2-(2-Methoxyphenyl)ethenyl]-3,4,5,6,7,9-hexahydro-2<i>H</i>- xanthene-1,8-dione |
| Formula |
C22 H22 O4 |
| Calculated formula |
C22 H22 O4 |
| SMILES |
O1C2=C(C(=O)CCC2)C(C2=C1CCCC2=O)/C=C/c1ccccc1OC |
| Title of publication |
9-[(<i>E</i>)-2-(2-Methoxyphenyl)ethenyl]-3,4,5,6,7,9-hexahydro-2<i>H</i>-xanthene-1,8-dione |
| Authors of publication |
Cha, Joo Hwan; Pae, Ae Nim; Lee, Jae Kyun; Cho, Yong Seo |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
2 |
| Pages of publication |
o454 |
| a |
8.5396 ± 0.0005 Å |
| b |
9.9243 ± 0.0007 Å |
| c |
21.9501 ± 0.0013 Å |
| α |
90° |
| β |
102.546 ± 0.0014° |
| γ |
90° |
| Cell volume |
1815.8 ± 0.2 Å3 |
| Cell temperature |
296 K |
| Ambient diffraction temperature |
296 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for significantly intense reflections |
0.0439 |
| Weighted residual factors for all reflections included in the refinement |
0.1361 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.083 |
| Diffraction radiation wavelength |
0.71075 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2233458.html