Information card for entry 2233523
Chemical name |
1,1,4,4-Tetra-<i>tert</i>-butyl-1,4-dichloro-2,2,3,3-tetraphenyltetrasilane |
Formula |
C40 H56 Cl2 Si4 |
Calculated formula |
C40 H56 Cl2 Si4 |
SMILES |
C(C)(C)([Si](Cl)(C(C)(C)C)[Si](c1ccccc1)(c1ccccc1)[Si](c1ccccc1)(c1ccccc1)[Si](C(C)(C)C)(C(C)(C)C)Cl)C |
Title of publication |
1,1,4,4-Tetra-<i>tert</i>-butyl-1,4-dichloro-2,2,3,3-tetraphenyltetrasilane |
Authors of publication |
Otsuka, Kyohei; Ishida, Shintaro; Kyushin, Soichiro |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2012 |
Journal volume |
68 |
Journal issue |
2 |
Pages of publication |
o424 |
a |
9.6981 ± 0.0008 Å |
b |
15.3893 ± 0.0011 Å |
c |
13.8546 ± 0.0011 Å |
α |
90° |
β |
105.772 ± 0.0007° |
γ |
90° |
Cell volume |
1989.9 ± 0.3 Å3 |
Cell temperature |
153 ± 2 K |
Ambient diffraction temperature |
153 ± 2 K |
Number of distinct elements |
4 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/n 1 |
Hall space group symbol |
-P 2yn |
Residual factor for all reflections |
0.0382 |
Residual factor for significantly intense reflections |
0.0374 |
Weighted residual factors for significantly intense reflections |
0.0933 |
Weighted residual factors for all reflections included in the refinement |
0.0937 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.097 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2233523.html