Information card for entry 2234170
Chemical name |
Tetramethyl <i>N</i>,<i>N</i>'-(2,2,3,3,4,4-hexafluoro-1,5-dioxopentane- 1,5-diyl)bis(phosphoramidate) |
Formula |
C9 H14 F6 N2 O8 P2 |
Calculated formula |
C9 H14 F6 N2 O8 P2 |
SMILES |
C(C(C(=O)NP(=O)(OC)OC)(F)F)(F)(C(C(=O)NP(=O)(OC)OC)(F)F)F |
Title of publication |
Tetramethyl <i>N</i>,<i>N</i>'-(2,2,3,3,4,4-hexafluoro-1,5-dioxopentane-1,5-diyl)bis(phosphoramidate) |
Authors of publication |
Trush, Victor A.; Gubina, Kateryna E.; Gumeniuk, Yaroslav O.; Sliva, Tetyana Yu.; Konovalova, Irina S. |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2012 |
Journal volume |
68 |
Journal issue |
4 |
Pages of publication |
o1127 |
a |
19.7862 ± 0.0013 Å |
b |
5.2801 ± 0.0004 Å |
c |
16.9943 ± 0.0011 Å |
α |
90° |
β |
100.427 ± 0.006° |
γ |
90° |
Cell volume |
1746.1 ± 0.2 Å3 |
Cell temperature |
293 ± 2 K |
Ambient diffraction temperature |
293 ± 2 K |
Number of distinct elements |
6 |
Space group number |
15 |
Hermann-Mauguin space group symbol |
C 1 2/c 1 |
Hall space group symbol |
-C 2yc |
Residual factor for all reflections |
0.059 |
Residual factor for significantly intense reflections |
0.0369 |
Weighted residual factors for significantly intense reflections |
0.0965 |
Weighted residual factors for all reflections included in the refinement |
0.1057 |
Goodness-of-fit parameter for all reflections included in the refinement |
0.926 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2234170.html