Information card for entry 2234170
| Chemical name |
Tetramethyl <i>N</i>,<i>N</i>'-(2,2,3,3,4,4-hexafluoro-1,5-dioxopentane- 1,5-diyl)bis(phosphoramidate) |
| Formula |
C9 H14 F6 N2 O8 P2 |
| Calculated formula |
C9 H14 F6 N2 O8 P2 |
| SMILES |
C(C(C(=O)NP(=O)(OC)OC)(F)F)(F)(C(C(=O)NP(=O)(OC)OC)(F)F)F |
| Title of publication |
Tetramethyl <i>N</i>,<i>N</i>'-(2,2,3,3,4,4-hexafluoro-1,5-dioxopentane-1,5-diyl)bis(phosphoramidate) |
| Authors of publication |
Trush, Victor A.; Gubina, Kateryna E.; Gumeniuk, Yaroslav O.; Sliva, Tetyana Yu.; Konovalova, Irina S. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
4 |
| Pages of publication |
o1127 |
| a |
19.7862 ± 0.0013 Å |
| b |
5.2801 ± 0.0004 Å |
| c |
16.9943 ± 0.0011 Å |
| α |
90° |
| β |
100.427 ± 0.006° |
| γ |
90° |
| Cell volume |
1746.1 ± 0.2 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.059 |
| Residual factor for significantly intense reflections |
0.0369 |
| Weighted residual factors for significantly intense reflections |
0.0965 |
| Weighted residual factors for all reflections included in the refinement |
0.1057 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.926 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2234170.html