Information card for entry 2234375

Structure parameters

• Chemical name: Bis{<i>N</i>-[(diethylamino)dimethylsilyl]anilinido- κ^2^<i>N</i>,<i>N</i>'}nickel(II)
• Formula: C24 H42 N4 Ni Si2
• Calculated formula: C24 H42 N4 Ni Si2
• SMILES: c1(ccccc1)N1[Ni]2([N](CC)(CC)[Si]1(C)C)N(c1ccccc1)[Si](C)(C)[N]2(CC)CC
• Title of publication: Bis{<i>N</i>-[(diethylamino)dimethylsilyl]anilinido-κ^2^<i>N</i>,<i>N</i>'}nickel(II)
• Authors of publication: Chen, Juan; Li, Jing
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2012
• Journal volume: 68
• Journal issue: 4
• Pages of publication: m357
• a: 21.2631 ± 0.0011 Å
• b: 30.0347 ± 0.0016 Å
• c: 8.6228 ± 0.0005 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 5506.8 ± 0.5 ų
• Cell temperature: 295 ± 2 K
• Ambient diffraction temperature: 295 ± 2 K
• Number of distinct elements: 5
• Space group number: 43
• Hermann-Mauguin space group symbol: F d d 2
• Hall space group symbol: F 2 -2d
• Residual factor for all reflections: 0.0462
• Residual factor for significantly intense reflections: 0.0399
• Weighted residual factors for significantly intense reflections: 0.1001
• Weighted residual factors for all reflections included in the refinement: 0.1041
• Goodness-of-fit parameter for all reflections included in the refinement: 1.042
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes