Information card for entry 2234776
| Common name |
4,10-dithiatricyclo[7.3.0.0^3,7^]dodeca-1(9),3(7),5,11-tetraene-2,8-dione |
| Chemical name |
Benzo[1,2-<i>b</i>:4,5-<i>b</i>']dithiophene-4,8-dione |
| Formula |
C10 H4 O2 S2 |
| Calculated formula |
C10 H4 O2 S2 |
| SMILES |
O=C1c2sccc2C(=O)c2c1ccs2 |
| Title of publication |
Benzo[1,2-<i>b</i>:4,5-<i>b</i>']dithiophene-4,8-dione |
| Authors of publication |
Ramirez, Amanda L.; Chan, Benny C.; de Lill, Daniel T. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
5 |
| Pages of publication |
o1428 |
| a |
5.6402 ± 0.0005 Å |
| b |
5.7745 ± 0.0005 Å |
| c |
13.6223 ± 0.0012 Å |
| α |
90° |
| β |
97.371 ± 0.001° |
| γ |
90° |
| Cell volume |
440 ± 0.07 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0802 |
| Residual factor for significantly intense reflections |
0.0683 |
| Weighted residual factors for significantly intense reflections |
0.2274 |
| Weighted residual factors for all reflections included in the refinement |
0.2375 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.093 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2234776.html