Information card for entry 2235428
| Chemical name |
2,2'-[2,5-Bis(hexyloxy)-1,4-phenylene]dithiophene |
| Formula |
C26 H34 O2 S2 |
| Calculated formula |
C26 H34 O2 S2 |
| SMILES |
CCCCCCOc1cc(c2cccs2)c(cc1c1cccs1)OCCCCCC |
| Title of publication |
2,2'-[2,5-Bis(hexyloxy)-1,4-phenylene]dithiophene |
| Authors of publication |
Teh, Chin Hoong; Mat Salleh, Muhammad; Mohamed Tahir, Mohamed Ibrahim; Daik, Rusli; Kassim, Mohammad B. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
7 |
| Pages of publication |
o1976 |
| a |
12.2996 ± 0.0003 Å |
| b |
5.4298 ± 0.0001 Å |
| c |
17.6872 ± 0.0004 Å |
| α |
90° |
| β |
103.982 ± 0.002° |
| γ |
90° |
| Cell volume |
1146.23 ± 0.04 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.043 |
| Residual factor for significantly intense reflections |
0.0398 |
| Weighted residual factors for significantly intense reflections |
0.1093 |
| Weighted residual factors for all reflections included in the refinement |
0.1133 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.037 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2235428.html