Information card for entry 2235918
Chemical name |
<i>cis</i>-Diiodido(<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-\ tetramethylethylenediamine-κ^2^<i>N</i>,<i>N</i>')palladium(II) |
Formula |
C6 H16 I2 N2 Pd |
Calculated formula |
C6 H16 I2 N2 Pd |
SMILES |
C1[N](C)(C)[Pd](I)(I)[N](C1)(C)C |
Title of publication |
<i>cis</i>-Diiodido(<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylethylenediamine-κ^2^<i>N</i>,<i>N</i>')palladium(II) |
Authors of publication |
Abellán-López, Antonio; Chicote-Olalla, María Teresa; Bautista-Cerezo, Delia |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2012 |
Journal volume |
68 |
Journal issue |
8 |
Pages of publication |
m1129 |
a |
7.9266 ± 0.0004 Å |
b |
14.6911 ± 0.0007 Å |
c |
10.5309 ± 0.0005 Å |
α |
90° |
β |
107.262 ± 0.002° |
γ |
90° |
Cell volume |
1171.09 ± 0.1 Å3 |
Cell temperature |
100 ± 2 K |
Ambient diffraction temperature |
100 ± 2 K |
Number of distinct elements |
5 |
Space group number |
15 |
Hermann-Mauguin space group symbol |
C 1 2/c 1 |
Hall space group symbol |
-C 2yc |
Residual factor for all reflections |
0.024 |
Residual factor for significantly intense reflections |
0.0232 |
Weighted residual factors for significantly intense reflections |
0.0592 |
Weighted residual factors for all reflections included in the refinement |
0.0597 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.135 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2235918.html