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Information card for entry 2236093
Preview
Coordinates | 2236093.cif |
---|---|
Structure factors | 2236093.hkl |
Original IUCr paper | HTML |
Chemical name | Di-μ-chlorido-μ-(dimethyl sulfide)-bis{dichlorido[(dimethyl selenide-κ<i>Se</i>)(dimethyl sulfide-κ<i>S</i>)(0.65/0.35)]niobium(III)}(<i>Nb</i>—<i>Nb</i>) |
---|---|
Formula | C6 H18 Cl6 Nb2 S1.7 Se1.3 |
Calculated formula | C6 H18.0024 Cl6 Nb2 S1.706 Se1.294 |
Title of publication | Di-μ-chlorido-μ-(dimethyl sulfide)-bis{dichlorido[(dimethyl selenide-κ<i>Se</i>)(dimethyl sulfide-κ<i>S</i>)(0.65/0.35)]niobium(III)}(<i>Nb</i>—<i>Nb</i>) |
Authors of publication | Matsuura, Masatoshi; Fujihara, Takashi; Nagasawa, Akira; Ng, Seik Weng |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2012 |
Journal volume | 68 |
Journal issue | 9 |
Pages of publication | m1166 |
a | 13.3314 ± 0.0011 Å |
b | 13.5952 ± 0.0012 Å |
c | 10.6649 ± 0.0009 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1932.9 ± 0.3 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 60 |
Hermann-Mauguin space group symbol | P b c n |
Hall space group symbol | -P 2n 2ab |
Residual factor for all reflections | 0.0271 |
Residual factor for significantly intense reflections | 0.023 |
Weighted residual factors for significantly intense reflections | 0.0546 |
Weighted residual factors for all reflections included in the refinement | 0.0567 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.026 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | Yes |
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