Information card for entry 2236339
| Chemical name |
Tetrakis[μ-1,3-bis(4,5-dihydro-1,3-oxazol-2-yl)benzene- κ^2^<i>N</i>:<i>N</i>']trisilver(I) tris(hexafluoridophosphate) |
| Formula |
C48 H48 Ag3 F18 N8 O8 P3 |
| Calculated formula |
C48 H48 Ag3 F18 N8 O8 P3 |
| Title of publication |
Tetrakis[μ-1,3-bis(4,5-dihydro-1,3-oxazol-2-yl)benzene-κ^2^<i>N</i>:<i>N</i>']trisilver(I) tris(hexafluoridophosphate) |
| Authors of publication |
Yeh, Chun-Wei; Ho, Yuh-Wen; Lee, Hsun-Tsing; Wang, Ju-Chun; Suen, Maw-Cherng |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
9 |
| Pages of publication |
m1170 |
| a |
22.7473 ± 0.0016 Å |
| b |
11.4521 ± 0.0019 Å |
| c |
24.1382 ± 0.0015 Å |
| α |
90° |
| β |
116.014 ± 0.007° |
| γ |
90° |
| Cell volume |
5651 ± 1.1 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
7 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0668 |
| Residual factor for significantly intense reflections |
0.0503 |
| Weighted residual factors for significantly intense reflections |
0.125 |
| Weighted residual factors for all reflections included in the refinement |
0.1366 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.009 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2236339.html