Information card for entry 2237049
| Chemical name |
Diethyl 3,4-dimethylthieno[2,3-<i>b</i>]thiophene-2,5-dicarboxylate |
| Formula |
C14 H16 O4 S2 |
| Calculated formula |
C14 H16 O4 S2 |
| SMILES |
s1c2sc(c(c2c(c1C(=O)OCC)C)C)C(=O)OCC |
| Title of publication |
Diethyl 3,4-dimethylthieno[2,3-<i>b</i>]thiophene-2,5-dicarboxylate |
| Authors of publication |
Akkurt, Mehmet; Kennedy, Alan R.; Younes, Sabry H. H.; Mohamed, Shaaban K.; Miller, Gary J. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
12 |
| Pages of publication |
o3332 - o3333 |
| a |
7.3497 ± 0.0003 Å |
| b |
8.472 ± 0.0004 Å |
| c |
12.8629 ± 0.0005 Å |
| α |
102.77 ± 0.003° |
| β |
99.545 ± 0.003° |
| γ |
107.779 ± 0.004° |
| Cell volume |
719.96 ± 0.06 Å3 |
| Cell temperature |
123 ± 2 K |
| Ambient diffraction temperature |
123 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0638 |
| Residual factor for significantly intense reflections |
0.0445 |
| Weighted residual factors for significantly intense reflections |
0.0951 |
| Weighted residual factors for all reflections included in the refinement |
0.1061 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.041 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/2237049.html