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Information card for entry 2237261
Preview
Coordinates | 2237261.cif |
---|---|
Structure factors | 2237261.hkl |
Original IUCr paper | HTML |
Chemical name | Bis[μ-bis(diphenylphosphanyl)methane-κ^2^<i>P</i>:<i>P</i>'](μ-1- ethylthiourea-κ^2^<i>S</i>:<i>S</i>)bis[iodidocopper(I)] acetonitrile sesquisolvate |
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Formula | C56 H56.5 Cu2 I2 N3.5 P4 S |
Calculated formula | C56 H56.5 Cu2 I2 N3.5 P4 S |
Title of publication | Bis[μ-bis(diphenylphosphanyl)methane-κ^2^<i>P</i>:<i>P</i>'](μ-1-ethylthiourea-κ^2^<i>S</i>:<i>S</i>)bis[iodidocopper(I)] acetonitrile sesquisolvate |
Authors of publication | Nimthong, Ruthairat; Wattanakanjana, Yupa; Pakawatchai, Chaveng |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2013 |
Journal volume | 69 |
Journal issue | 1 |
Pages of publication | m68 - m69 |
a | 13.7751 ± 0.0006 Å |
b | 24.5147 ± 0.0011 Å |
c | 18.0172 ± 0.0008 Å |
α | 90° |
β | 111.72 ± 0.001° |
γ | 90° |
Cell volume | 5652.3 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0612 |
Residual factor for significantly intense reflections | 0.0458 |
Weighted residual factors for significantly intense reflections | 0.0958 |
Weighted residual factors for all reflections included in the refinement | 0.1006 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.054 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2237261.html
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Users of the data should acknowledge the original authors of the
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