Information card for entry 2237410
| Chemical name |
3-[2-Cyclopropyl-1-(2-fluorophenyl)-2-oxoethyl]-5-(4- methylsulfanylbenzylidene)-1,3-thiazolidine-2,4-dione |
| Formula |
C22 H18 F N O3 S2 |
| Calculated formula |
C22 H18 F N O3 S2 |
| SMILES |
C1(=O)N(C(=O)/C(=C/c2ccc(cc2)SC)S1)C(C(=O)C1CC1)c1ccccc1F |
| Title of publication |
3-[2-Cyclopropyl-1-(2-fluorophenyl)-2-oxoethyl]-5-(4-methylsulfanylbenzylidene)-1,3-thiazolidine-2,4-dione |
| Authors of publication |
Suresh, J.; Venkateshan, M.; Ponnuchamy, S.; Kumar, R. Ranjith; Lakshman, P. L. Nilantha |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2013 |
| Journal volume |
69 |
| Journal issue |
2 |
| Pages of publication |
o188 |
| a |
7.657 ± 0.003 Å |
| b |
15.799 ± 0.005 Å |
| c |
17.425 ± 0.006 Å |
| α |
90° |
| β |
95.641 ± 0.005° |
| γ |
90° |
| Cell volume |
2097.7 ± 1.3 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0834 |
| Residual factor for significantly intense reflections |
0.0472 |
| Weighted residual factors for significantly intense reflections |
0.1245 |
| Weighted residual factors for all reflections included in the refinement |
0.1489 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.022 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2237410.html