Information card for entry 2238370
Chemical name |
Bis(1-ethyl-4,4'-bipyridin-1-ium) bis(1,2-dicyanoethene-1,2-dithiolato-κ^2^<i>S</i>,<i>S</i>')nickelate(II) |
Formula |
C32 H26 N8 Ni S4 |
Calculated formula |
C32 H26 N8 Ni S4 |
SMILES |
[Ni]12(SC(=C(S2)C#N)C#N)SC(=C(S1)C#N)C#N.c1cc(cc[n+]1CC)c1ccncc1.c1cc(cc[n+]1CC)c1ccncc1 |
Title of publication |
Bis(1-ethyl-4,4'-bipyridin-1-ium) bis(1,2-dicyanoethene-1,2-dithiolato-κ^2^<i>S</i>,<i>S</i>')nickelate(II) |
Authors of publication |
Chen, Yao; Ning, Wei-hua; Liu, Jian-Lan |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2013 |
Journal volume |
69 |
Journal issue |
8 |
Pages of publication |
m428 |
a |
7.4505 ± 0.0013 Å |
b |
12.793 ± 0.002 Å |
c |
17.745 ± 0.003 Å |
α |
78.664 ± 0.002° |
β |
86.558 ± 0.002° |
γ |
80.344 ± 0.002° |
Cell volume |
1634.2 ± 0.5 Å3 |
Cell temperature |
296 ± 2 K |
Ambient diffraction temperature |
296 ± 2 K |
Number of distinct elements |
5 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.1348 |
Residual factor for significantly intense reflections |
0.051 |
Weighted residual factors for significantly intense reflections |
0.0968 |
Weighted residual factors for all reflections included in the refinement |
0.1279 |
Goodness-of-fit parameter for all reflections included in the refinement |
0.965 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2238370.html