Information card for entry 2238496
| Chemical name |
Bis[<i>O</i>,<i>O</i>'-bis(4-<i>tert</i>-butylphenyl) dithiophosphato-κ^2^<i>S</i>,<i>S</i>']bis(pyridine-κ<i>N</i>)lead(II) |
| Formula |
C50 H62 N2 O4 P2 Pb S4 |
| Calculated formula |
C50 H62 N2 O4 P2 Pb S4 |
| Title of publication |
Bis[<i>O</i>,<i>O</i>'-bis(4-<i>tert</i>-butylphenyl) dithiophosphato-κ^2^<i>S</i>,<i>S</i>']bis(pyridine-κ<i>N</i>)lead(II) |
| Authors of publication |
Zhang, Xiulan; Xie, Bin; He, Linxin; Lu, Lu; Chen, Neng |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2013 |
| Journal volume |
69 |
| Journal issue |
9 |
| Pages of publication |
m524 |
| a |
12.426 ± 0.0003 Å |
| b |
12.9136 ± 0.0003 Å |
| c |
17.9749 ± 0.0004 Å |
| α |
89.7528 ± 0.0018° |
| β |
79.4467 ± 0.0019° |
| γ |
71.298 ± 0.002° |
| Cell volume |
2681.23 ± 0.11 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
7 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0462 |
| Residual factor for significantly intense reflections |
0.0328 |
| Weighted residual factors for significantly intense reflections |
0.0619 |
| Weighted residual factors for all reflections included in the refinement |
0.0675 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.016 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2238496.html