Information card for entry 2238496
Chemical name |
Bis[<i>O</i>,<i>O</i>'-bis(4-<i>tert</i>-butylphenyl) dithiophosphato-κ^2^<i>S</i>,<i>S</i>']bis(pyridine-κ<i>N</i>)lead(II) |
Formula |
C50 H62 N2 O4 P2 Pb S4 |
Calculated formula |
C50 H62 N2 O4 P2 Pb S4 |
Title of publication |
Bis[<i>O</i>,<i>O</i>'-bis(4-<i>tert</i>-butylphenyl) dithiophosphato-κ^2^<i>S</i>,<i>S</i>']bis(pyridine-κ<i>N</i>)lead(II) |
Authors of publication |
Zhang, Xiulan; Xie, Bin; He, Linxin; Lu, Lu; Chen, Neng |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2013 |
Journal volume |
69 |
Journal issue |
9 |
Pages of publication |
m524 |
a |
12.426 ± 0.0003 Å |
b |
12.9136 ± 0.0003 Å |
c |
17.9749 ± 0.0004 Å |
α |
89.7528 ± 0.0018° |
β |
79.4467 ± 0.0019° |
γ |
71.298 ± 0.002° |
Cell volume |
2681.23 ± 0.11 Å3 |
Cell temperature |
150 ± 2 K |
Ambient diffraction temperature |
150 ± 2 K |
Number of distinct elements |
7 |
Space group number |
2 |
Hermann-Mauguin space group symbol |
P -1 |
Hall space group symbol |
-P 1 |
Residual factor for all reflections |
0.0462 |
Residual factor for significantly intense reflections |
0.0328 |
Weighted residual factors for significantly intense reflections |
0.0619 |
Weighted residual factors for all reflections included in the refinement |
0.0675 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.016 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
Yes |
Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2238496.html