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Information card for entry 2239165
Preview
Coordinates | 2239165.cif |
---|---|
Structure factors | 2239165.hkl |
Original IUCr paper | HTML |
Chemical name | 4-Methyl-<i>N</i>-(4-methylphenylsulfonyl)-<i>N</i>-[4-(4-methylphenyl)-1,3-thiazol-2-yl]benzenesulfonamide |
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Formula | C24 H22 N2 O4 S3 |
Calculated formula | C24 H22 N2 O4 S3 |
SMILES | Cc1ccc(cc1)c1csc(n1)N(S(=O)(=O)c1ccc(cc1)C)S(=O)(=O)c1ccc(cc1)C |
Title of publication | 4-Methyl-<i>N</i>-(4-methylphenylsulfonyl)-<i>N</i>-[4-(4-methylphenyl)-1,3-thiazol-2-yl]benzenesulfonamide |
Authors of publication | Carballo, Rubén M.; Hernández-Ortega, Simón; Padilla-Montaño, Nayely; Reyes-Martínez, Reyna; Mirón-López, Gumersindo |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2014 |
Journal volume | 70 |
Journal issue | 1 |
Pages of publication | o6 - o7 |
a | 8.3322 ± 0.0002 Å |
b | 12.063 ± 0.0003 Å |
c | 23.5756 ± 0.0006 Å |
α | 84.615 ± 0.001° |
β | 87.022 ± 0.001° |
γ | 85.482 ± 0.001° |
Cell volume | 2349.45 ± 0.1 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0493 |
Residual factor for significantly intense reflections | 0.0387 |
Weighted residual factors for significantly intense reflections | 0.0971 |
Weighted residual factors for all reflections included in the refinement | 0.1035 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.982 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2239165.html
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Users of the data should acknowledge the original authors of the
structural data.