Information card for entry 2239464

Structure parameters

• Chemical name: Tetrakis(2,3,5,5-tetramethylhexen-2-yl)silane
• Formula: C40 H76 Si
• Calculated formula: C40 H76 Si
• SMILES: C(C(=C(\CC(C)(C)C)C)\C)[Si](CC(=C(\CC(C)(C)C)C)\C)(C/C(=C(CC(C)(C)C)\C)C)C/C(=C(CC(C)(C)C)\C)C
• Title of publication: Tetrakis(2,3,5,5-tetramethylhexen-2-yl)silane
• Authors of publication: Meyer-Wegner, Frank; Bolte, Michael; Lerner, Hans-Wolfram
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2014
• Journal volume: 70
• Journal issue: 3
• Pages of publication: o376
• a: 12.578 ± 0.0011 Å
• b: 12.578 ± 0.0011 Å
• c: 25.053 ± 0.003 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 3963.5 ± 0.7 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 3
• Space group number: 88
• Hermann-Mauguin space group symbol: I 41/a :2
• Hall space group symbol: -I 4ad
• Residual factor for all reflections: 0.0723
• Residual factor for significantly intense reflections: 0.0511
• Weighted residual factors for significantly intense reflections: 0.1266
• Weighted residual factors for all reflections included in the refinement: 0.1359
• Goodness-of-fit parameter for all reflections included in the refinement: 1.081
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes