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Information card for entry 2240225
Preview
Coordinates | 2240225.cif |
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Structure factors | 2240225.hkl |
Original paper (by DOI) | HTML |
Common name | bis{2-[Diphenyl(selanylidene)phosphanyl]phenyl} ether |
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Chemical name | (2-{2-[Diphenyl(selanylidene)phosphanyl]phenoxy}phenyl)diphenyl-λ^5^-phosphaneselone |
Formula | C36 H28 O P2 Se2 |
Calculated formula | C36 H28 O P2 Se2 |
SMILES | O(c1c(P(=[Se])(c2ccccc2)c2ccccc2)cccc1)c1c(P(c2ccccc2)(c2ccccc2)=[Se])cccc1 |
Title of publication | Crystal structures of bis[2-(diphenylphosphinothioyl)phenyl] ether and bis{2-[diphenyl(selanylidene)phosphanyl]phenyl} ether |
Authors of publication | Janzen, Daron E.; Kooyman, Arianna M.; Lange, Kayla A. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2014 |
Journal volume | 70 |
Journal issue | 12 |
Pages of publication | 536 - 540 |
a | 14.0964 ± 0.0015 Å |
b | 13.0854 ± 0.0013 Å |
c | 17.5918 ± 0.0018 Å |
α | 90° |
β | 109.226 ± 0.008° |
γ | 90° |
Cell volume | 3064 ± 0.6 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0424 |
Residual factor for significantly intense reflections | 0.0321 |
Weighted residual factors for significantly intense reflections | 0.0624 |
Weighted residual factors for all reflections included in the refinement | 0.0659 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2240225.html
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