Information card for entry 2240243
| Chemical name |
2,2,3,3-Tetramethyl-1,1,1,4,4,4-hexaphenyltetragermane |
| Formula |
C40 H42 Ge4 |
| Calculated formula |
C40 H42 Ge4 |
| SMILES |
C[Ge](C)([Ge](c1ccccc1)(c1ccccc1)c1ccccc1)[Ge](C)(C)[Ge](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication |
Crystal structure of 2,2,3,3-tetramethyl-1,1,1,4,4,4-hexaphenyltetragermane |
| Authors of publication |
Zaitsev, Kirill V.; Karlov, Sergey S.; Zaitseva, Galina S.; Alizade, Ali; Slovokhotov, Yuri L. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2014 |
| Journal volume |
70 |
| Journal issue |
12 |
| Pages of publication |
o1273 - o1274 |
| a |
9.6402 ± 0.0005 Å |
| b |
13.6386 ± 0.0006 Å |
| c |
14.0503 ± 0.0007 Å |
| α |
90° |
| β |
104.56 ± 0.001° |
| γ |
90° |
| Cell volume |
1787.99 ± 0.15 Å3 |
| Cell temperature |
120 ± 2 K |
| Ambient diffraction temperature |
120 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.044 |
| Residual factor for significantly intense reflections |
0.0301 |
| Weighted residual factors for significantly intense reflections |
0.061 |
| Weighted residual factors for all reflections included in the refinement |
0.0663 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.045 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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