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Information card for entry 2241177
Preview
Coordinates | 2241177.cif |
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Structure factors | 2241177.hkl |
Original IUCr paper | HTML |
Chemical name | Tris[μ~2~-bis(diphenylphosphanyl)methane-κ^2^<i>P</i>:<i>P</i>']di-μ~3~-iodido-trisilver(I) iodide‒<i>N</i>-phenylthiourea (1/1) |
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Formula | C82 H74 Ag3 I3 N2 P6 S |
Calculated formula | C82 H74 Ag3 I3 N2 P6 S |
Title of publication | Crystal structure of tris[μ~2~-bis(diphenylphosphanyl)methane-κ^2^<i>P</i>:<i>P</i>']di-μ~3~-iodido-trisilver(I) iodide‒<i>N</i>-phenylthiourea (1/1) |
Authors of publication | Wattanakanjana, Yupa; Nimthong-Roldán, Arunpatcha; Palavat, Suthida; Puetpaiboon, Walailak |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2015 |
Journal volume | 71 |
Journal issue | 11 |
Pages of publication | m187 - m188 |
a | 10.8177 ± 0.0004 Å |
b | 28.568 ± 0.0011 Å |
c | 26.1639 ± 0.0011 Å |
α | 90° |
β | 95.315 ± 0.002° |
γ | 90° |
Cell volume | 8050.9 ± 0.5 Å3 |
Cell temperature | 296 ± 2 K |
Ambient diffraction temperature | 296 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0478 |
Residual factor for significantly intense reflections | 0.0394 |
Weighted residual factors for significantly intense reflections | 0.0975 |
Weighted residual factors for all reflections included in the refinement | 0.1043 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.081 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | Yes |
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