Information card for entry 2241677

Structure parameters

• Chemical name: Tetrakis[μ~2~-bis(trimethylsilyl)amido]-μ~4~-oxido-dicobalt(II)disodium
• Formula: C24 H72 Co2 N4 Na2 O Si8
• Calculated formula: C24 H72 Co2 N4 Na2 O Si8
• SMILES: C[Si](C)(C)[N]1([Co]([N]2([Si](C)(C)C)[Si](C)(C)C)[O]34[Co]([N]([Na]23)([Si](C)(C)C)[Si](C)(C)C)[N]([Na]14)([Si](C)(C)C)[Si](C)(C)C)[Si](C)(C)C
• Title of publication: Crystal structure of the inverse crown ether tetrakis[μ~2~-bis(trimethylsilyl)amido]-μ~4~-oxido-dicobalt(II)disodium, [Co~2~Na~2~{μ~2~-N(SiMe~3~)~2~}~4~](μ~4~-O)
• Authors of publication: Hansen, Christopher B.; Filatov, Alexander S.; Hillhouse, Gregory L.
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2016
• Journal volume: 72
• Journal issue: 6
• Pages of publication: 780 - 784
• a: 8.8839 ± 0.0018 Å
• b: 10.591 ± 0.002 Å
• c: 12.7 ± 0.003 Å
• α: 96.75 ± 0.04°
• β: 108.93 ± 0.03°
• γ: 99.15 ± 0.03°
• Cell volume: 1097.5 ± 0.5 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.091
• Residual factor for significantly intense reflections: 0.0646
• Weighted residual factors for significantly intense reflections: 0.1402
• Weighted residual factors for all reflections included in the refinement: 0.1535
• Goodness-of-fit parameter for all reflections included in the refinement: 1.025
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes