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Information card for entry 2241740
Preview
Coordinates | 2241740.cif |
---|---|
Structure factors | 2241740.hkl |
Original IUCr paper | HTML |
Chemical name | <i>N</i>'-[(1<i>E</i>)-(5-Nitrofuran-2-yl)methylidene]thiophene-2-carbohydrazide |
---|---|
Formula | C10 H7 N3 O4 S |
Calculated formula | C10 H7 N3 O4 S |
SMILES | s1c(ccc1)C(=O)N/N=C/c1oc(N(=O)=O)cc1 |
Title of publication | <i>N</i>'-[(1<i>E</i>)-(5-Nitrofuran-2-yl)methylidene]thiophene-2-carbohydrazide: crystal structure and Hirshfeld surface analysis |
Authors of publication | Cardoso, Laura N. F.; Nogueira, Thais C. M.; Wardell, James L.; Wardell, Solange M. S. V.; de Souza, Marcus V. N.; Jotani, Mukesh M.; Tiekink, Edward R. T. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2016 |
Journal volume | 72 |
Journal issue | 7 |
Pages of publication | 1025 - 1031 |
a | 17.4072 ± 0.0016 Å |
b | 17.4072 ± 0.0016 Å |
c | 14.4881 ± 0.001 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4390 ± 0.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 110 |
Hermann-Mauguin space group symbol | I 41 c d |
Hall space group symbol | I 4bw -2c |
Residual factor for all reflections | 0.0508 |
Residual factor for significantly intense reflections | 0.0449 |
Weighted residual factors for significantly intense reflections | 0.1093 |
Weighted residual factors for all reflections included in the refinement | 0.1134 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.048 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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The link is: https://www.crystallography.net/2241740.html
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