Information card for entry 2241774

Structure parameters

• Chemical name: Bis[<i>N</i>,<i>N</i>-bis(2-methoxyethyl)dithiocarbamato-κ^2^<i>S</i>,<i>S</i>']diphenyltin(IV)
• Formula: C22 H30 N2 O2 S4 Sn
• Calculated formula: C22 H30 N2 O2 S4 Sn
• SMILES: C1(=[S][Sn]2(S1)(c1ccccc1)(SC(=[S]2)N(C)CCOC)c1ccccc1)N(CCOC)C
• Title of publication: Distinct coordination geometries in bis[<i>N</i>,<i>N</i>-bis(2-methoxyethyl)dithiocarbamato-κ^2^<i>S</i>,<i>S</i>']diphenyltin(IV) and bis[<i>N</i>-(2-methoxyethyl)-<i>N</i>-methyldithiocarbamato-κ^2^<i>S</i>,<i>S</i>']diphenyltin(IV): crystal structures and Hirshfeld surface analysis
• Authors of publication: Mohamad, Rapidah; Awang, Normah; Jotani, Mukesh M.; Tiekink, Edward R. T.
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2016
• Journal volume: 72
• Journal issue: 8
• Pages of publication: 1130 - 1137
• a: 18.3808 ± 0.0014 Å
• b: 8.2809 ± 0.0004 Å
• c: 19.083 ± 0.003 Å
• α: 90°
• β: 118.071 ± 0.008°
• γ: 90°
• Cell volume: 2562.9 ± 0.5 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 6
• Space group number: 15
• Hermann-Mauguin space group symbol: C 1 2/c 1
• Hall space group symbol: -C 2yc
• Residual factor for all reflections: 0.0304
• Residual factor for significantly intense reflections: 0.0256
• Weighted residual factors for significantly intense reflections: 0.0604
• Weighted residual factors for all reflections included in the refinement: 0.0628
• Goodness-of-fit parameter for all reflections included in the refinement: 1.065
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes