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Information card for entry 2241820
Preview
Coordinates | 2241820.cif |
---|---|
Structure factors | 2241820.hkl |
Original IUCr paper | HTML |
Chemical name | Ethyl {2-[4-(4-isopropylphenyl)thiazol-2-yl]phenyl}carbamate |
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Formula | C21 H22 N2 O2 S |
Calculated formula | C21 H22 N2 O2 S |
SMILES | s1c(nc(c1)c1ccc(cc1)C(C)C)c1c(NC(=O)OCC)cccc1 |
Title of publication | Crystal structures of ethyl {2-[4-(4-isopropylphenyl)thiazol-2-yl]phenyl}carbamate and ethyl {2-[4-(3-nitrophenyl)thiazol-2-yl]phenyl}carbamate |
Authors of publication | Sukhonosova, Elena V.; Sokov, Sergey A.; Ostapenko, Gennady I.; Bunev, Alexander S.; Dorovatovskii, Pavel V.; Zubavichus, Yan V.; Khrustalev, Victor N. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2016 |
Journal volume | 72 |
Journal issue | 9 |
Pages of publication | 1321 - 1325 |
a | 5.4534 ± 0.0011 Å |
b | 17.203 ± 0.003 Å |
c | 20.06 ± 0.004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1881.9 ± 0.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0734 |
Residual factor for significantly intense reflections | 0.0524 |
Weighted residual factors for significantly intense reflections | 0.1088 |
Weighted residual factors for all reflections included in the refinement | 0.1225 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.964 |
Diffraction radiation wavelength | 0.9699 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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The link is: https://www.crystallography.net/2241820.html
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