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Information card for entry 2241828
Preview
Coordinates | 2241828.cif |
---|---|
Structure factors | 2241828.hkl |
Original IUCr paper | HTML |
Chemical name | <i>N</i>-[(4-Phenylthiazol-2-yl)carbamothioyl]benzamide |
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Formula | C17 H13 N3 O S2 |
Calculated formula | C17 H13 N3 O S2 |
SMILES | S=C(Nc1scc(n1)c1ccccc1)NC(=O)c1ccccc1 |
Title of publication | Crystal structures of <i>N</i>-[(4-phenylthiazol-2-yl)carbamothioyl]benzamide and <i>N</i>-{[4-(4-bromophenyl)thiazol-2-yl]carbamothioyl}benzamide from synchrotron X-ray diffraction |
Authors of publication | Gantimurova, Ekaterina S.; Bunev, Alexander S.; Talina, Kristina Yu.; Ostapenko, Gennady I.; Dorovatovskii, Pavel V.; Lobanov, Nikolai N.; Khrustalev, Victor N. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2016 |
Journal volume | 72 |
Journal issue | 9 |
Pages of publication | 1343 - 1347 |
a | 12.901 ± 0.003 Å |
b | 5.516 ± 0.0011 Å |
c | 23.143 ± 0.005 Å |
α | 90° |
β | 105.32 ± 0.03° |
γ | 90° |
Cell volume | 1588.4 ± 0.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0437 |
Residual factor for significantly intense reflections | 0.0355 |
Weighted residual factors for significantly intense reflections | 0.0898 |
Weighted residual factors for all reflections included in the refinement | 0.0953 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
Diffraction radiation wavelength | 0.9699 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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