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Information card for entry 2241971
Preview
Coordinates | 2241971.cif |
---|---|
Structure factors | 2241971.hkl |
Original IUCr paper | HTML |
Chemical name | 2-(Chloroselanyl)pyridine 1-oxide |
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Formula | C5 H4 Cl N O Se |
Calculated formula | C5 H4 Cl N O Se |
SMILES | [Se](Cl)c1n(=O)cccc1 |
Title of publication | The synthesis and crystal structure of 2-(chloroselanyl)pyridine 1-oxide: the first monomeric organoselenenyl chloride stabilized by an intramolecular secondary Se···O interaction |
Authors of publication | Askerov, Rizvan K.; Matsulevich, Zhanna V.; Borisova, Galina N.; Zalepkina, Svetlana A.; Smirnov, Vasiliy F.; Grishina, Maria M.; Dorovatovskii, Pavel V.; Borisov, Alexander V.; Khrustalev, Victor N. |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2016 |
Journal volume | 72 |
Journal issue | 12 |
Pages of publication | 1864 - 1866 |
a | 3.9601 ± 0.0008 Å |
b | 7.5102 ± 0.0015 Å |
c | 22.35 ± 0.005 Å |
α | 90° |
β | 94.32 ± 0.03° |
γ | 90° |
Cell volume | 662.8 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0834 |
Residual factor for significantly intense reflections | 0.0741 |
Weighted residual factors for significantly intense reflections | 0.1633 |
Weighted residual factors for all reflections included in the refinement | 0.1753 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.009 |
Diffraction radiation wavelength | 0.9699 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | Yes |
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The link is: https://www.crystallography.net/2241971.html
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