Information card for entry 2242502
Chemical name |
4-Phenyl-3-(thiophen-3-yl-methyl)-1<i>H</i>-1,2,4-triazole-5(4<i>H</i>)-thione |
Formula |
C13 H11 N3 S2 |
Calculated formula |
C13 H11 N3 S2 |
SMILES |
S=C1N(C(=NN1)Cc1cscc1)c1ccccc1 |
Title of publication |
Crystal structure and Hirshfield surface analysis of 4-phenyl-3-(thiophen-3-yl-methyl)-1<i>H</i>-1,2,4-triazole-5(4<i>H</i>)-thione |
Authors of publication |
Vu Quoc, Trung; Nguyen Ngoc, Linh; Do Ba, Dai; Pham Chien, Thang; Nguyen Huy, Hung; Van Meervelt, Luc |
Journal of publication |
Acta Crystallographica Section E |
Year of publication |
2018 |
Journal volume |
74 |
Journal issue |
6 |
Pages of publication |
812 - 815 |
a |
8.8257 ± 0.0008 Å |
b |
16.0776 ± 0.0016 Å |
c |
9.7437 ± 0.0009 Å |
α |
90° |
β |
116.383 ± 0.003° |
γ |
90° |
Cell volume |
1238.6 ± 0.2 Å3 |
Cell temperature |
100 K |
Ambient diffraction temperature |
100 K |
Number of distinct elements |
4 |
Space group number |
14 |
Hermann-Mauguin space group symbol |
P 1 21/c 1 |
Hall space group symbol |
-P 2ybc |
Residual factor for all reflections |
0.0419 |
Residual factor for significantly intense reflections |
0.0346 |
Weighted residual factors for significantly intense reflections |
0.0931 |
Weighted residual factors for all reflections included in the refinement |
0.0972 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.063 |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
No |
Has Fobs |
Yes |
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https://www.crystallography.net/2242502.html