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Information card for entry 2242702
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Coordinates | 2242702.cif |
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Structure factors | 2242702.hkl |
Original IUCr paper | HTML |
Common name | bis(dppe))nickel(II) bis(triflate) |
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Chemical name | Bis[1,2-bis(diphenylphosphanyl)ethane]nickel(II) bis(trifluoromethanesulfonate) |
Formula | C54 H48 F6 Ni O6 P4 S2 |
Calculated formula | C54 H48 F6 Ni O6 P4 S2 |
Title of publication | Crystal structure at 100K of bis[1,2-bis(diphenylphosphanyl)ethane]nickel(II) bis(trifluoromethanesulfonate): a possible negative thermal expansion molecular material |
Authors of publication | Cano-Benítez, Cristian A.; Metta-Magaña, Alejandro J.; Duarte-Ruiz, Álvaro |
Journal of publication | Acta Crystallographica Section E |
Year of publication | 2018 |
Journal volume | 74 |
Journal issue | 11 |
Pages of publication | 1678 - 1681 |
a | 11.0462 ± 0.0004 Å |
b | 16.1813 ± 0.0006 Å |
c | 14.3914 ± 0.0005 Å |
α | 90° |
β | 98.143 ± 0.001° |
γ | 90° |
Cell volume | 2546.41 ± 0.16 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0538 |
Residual factor for significantly intense reflections | 0.0402 |
Weighted residual factors for significantly intense reflections | 0.0886 |
Weighted residual factors for all reflections included in the refinement | 0.0989 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.043 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | Yes |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/2242702.html
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